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售價:1311  |
詳細資料ISBN：9780470027851 叢書系列：實用機械 規格：平裝 / 552頁 / 普通級/ 單色印刷 / 初版 出版地：台灣 內容簡介 MICROSTRUCTURAL CHARACTERIZATION IS USUALLY ACHIEVED BY ALLOWING SOME FORM OF PROBE TO INTERACT WITH A CAREFULLY PREPARED SPECIMEN. THE MOST COMMONLY USED PROBES ARE VISIBLE LIGHT, X-RAY RADIATION, A HIGH-ENERGY ELECTRON BEAM, OR A SHARP, FLEXIBLE NEEDLE. THESE FOUR TYPES OF PROBE FORM THE BASIS FOR OPTICAL MICROSCOPY, X-RAY DIFFRACTION, ELECTRON MICROSCOPY, AND SCANNING PROBE MICROSCOPY. 本書特色 AN ADDITIONAL CHAPTER HAS BEEN ADDED TO THE NEW EDITION TO COVER SURFACE PROBE MICROSCOPY, AND THERE ARE NEW SECTIONS ON DIGITAL IMAGE RECORDING AND ANALYSIS, ORIENTATION IMAGING MICROSCOPY, FOCUSED ION-BEAM INSTRUMENTS, ATOM-PROBE MICROSCOPY, AND 3-D IMAGE RECONSTRUCTION. AS WELL AS BEING FULLY UPDATED, THIS SECOND EDITION ALSO INCLUDES REVISED AND EXPANDED EXAMPLES AND EXERCISES. |
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資料來源：博客來
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